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Antiproton Flux, Antiproton-to-Proton Flux Ratio, and Properties of Elementary Particle Fluxes in Primary Cosmic Rays Measured with the Alpha Magnetic Spectrometer on the International Space Station

Academic Article
Publication Date:
2016
Short description:
Antiproton Flux, Antiproton-to-Proton Flux Ratio, and Properties of Elementary Particle Fluxes in Primary Cosmic Rays Measured with the Alpha Magnetic Spectrometer on the International Space Station / Aguilar, M., Ali Cavasonza, L., Alpat, B., Ambrosi, G., Arruda, L., Attig, N., Aupetit, S., Azzarello, P., Bachlechner, A., Barao, F., Barrau, A., Barrin, L., Bartoloni, A., Basara, L., Başecmez Du Pree, S., Battarbee, M., Battiston, R., Bazo, J., Becker, U., Behlmann, M., et al.. - In: PHYSICAL REVIEW LETTERS. - ISSN 0031-9007. - 117:9(2016), p. 091103. [10.1103/PhysRevLett.117.091103]
abstract:
A precision measurement by AMS of the antiproton flux and the antiproton-to-proton flux ratio in primary cosmic rays in the absolute rigidity range from 1 to 450 GV is presented based on 3.49×105 antiproton events and 2.42×109 proton events. The fluxes and flux ratios of charged elementary particles in cosmic rays are also presented. In the absolute rigidity range ∼60 to ∼500 GV, the antiproton p, proton p, and positron e+ fluxes are found to have nearly identical rigidity dependence and the electron e- flux exhibits a different rigidity dependence. Below 60 GV, the (p/p), (p/e+), and (p/e+) flux ratios each reaches a maximum. From ∼60 to ∼500 GV, the (p/p), (p/e+), and (p/e+) flux ratios show no rigidity dependence. These are new observations of the properties of elementary particles in the cosmos.
Iris type:
1.1 Articolo in rivista
Keywords:
Physics and Astronomy (all)
List of contributors:
Aguilar, M.; Ali Cavasonza, L.; Alpat, B.; Ambrosi, G.; Arruda, L.; Attig, N.; Aupetit, S.; Azzarello, P.; Bachlechner, A.; Barao, F.; Barrau, A.; Barrin, L.; Bartoloni, A.; Basara, L.; Başecmez Du Pree, S.; Battarbee, M.; Battiston, R.; Bazo, J.; Becker, U.; Behlmann, M.; Beischer, B.; Berdugo, J.; Bertucci, B.; Bindi, V.; Boella, G.; De Boer, W.; Bollweg, K.; Bonnivard, V.; Borgia, B.; Boschini, M. J.; Bourquin, M.; Bueno, E. F.; Burger, J.; Cadoux, F.; Cai, X. D.; Capell, M.; Caroff, S.; Casaus, J.; Castellini, G.; Cernuda, I.; Cervelli, F.; Chae, M. J.; Chang, Y. H.; Chen, A. I.; Chen, G. M.; Chen, H. S.; Cheng, L.; Chou, H. Y.; Choumilov, E.; Choutko, V.; Chung, C. H.; Clark, C.; Clavero, R.; Coignet, G.; Consolandi, C.; Contin, A.; Corti, C.; Coste, B.; Creus, W.; Crispoltoni, M.; Cui, Z.; Dai, Y. M.; Delgado, C.; Della Torre, S.; Demirköz, M. B.; Derome, L.; Di Falco, S.; Dimiccoli, F.; Díaz, C.; Von Doetinchem, P.; Dong, F.; Donnini, F.; Duranti, M.; D'Urso, Domenico; Egorov, A.; Eline, A.; Eronen, T.; Feng, J.; Fiandrini, E.; Finch, E.; Fisher, P.; Formato, V.; Galaktionov, Y.; Gallucci, G.; García, B.; García López, R. J.; Gargiulo, C.; Gast, H.; Gebauer, I.; Gervasi, M.; Ghelfi, A.; Giovacchini, F.; Goglov, P.; Gómez Coral, D. M.; Gong, J.; Goy, C.; Grabski, V.; Grandi, D.; Graziani, M.; Guerri, I.; Guo, K. H.; Habiby, M.; Haino, S.; Han, K. C.; He, Z. H.; Heil, M.; Hoffman, J.; Hsieh, T. H.; Huang, H.; Huang, Z. C.; Huh, C.; Incagli, M.; Ionica, M.; Jang, W. Y.; Jinchi, H.; Kang, S. C.; Kanishev, K.; Kim, G. N.; Kim, K. S.; Kirn, T. h.; Konak, C.; Kounina, O.; Kounine, A.; Koutsenko, V.; Krafczyk, M. S.; La Vacca, G.; Laudi, E.; Laurenti, G.; Lazzizzera, I.; Lebedev, A.; Lee, H. T.; Lee, S. C.; Leluc, C.; Li, H. S.; Li, J. Q.; Li, J. Q.; Li, Q.; Li, T. X.; Li, W.; Li, Z. H.; Li, Z. Y.; Lim, S.; Lin, C. H.; Lipari, P.; Lippert, T.; Liu, D.; Liu, Hu; Lu, S. Q.; Lu, Y. S.; Luebelsmeyer, K.; Luo, F.; Luo, J. Z.; Lv, S. S.; Majka, R.; Mañá, C.; Marín, J.; Martin, T.; Martínez, G.; Masi, N.; Maurin, D.; Menchaca Rocha, A.; Meng, Q.; Mo, D. C.; Morescalchi, L.; Mott, P.; Nelson, T.; Ni, J. Q.; Nikonov, N.; Nozzoli, F.; Nunes, P.; Oliva, A.; Orcinha, M.; Palmonari, F.; Palomares, C.; Paniccia, M.; Pauluzzi, M.; Pensotti, S.; Pereira, R.; Picot Clemente, N.; Pilo, F.; Pizzolotto, C.; Plyaskin, V.; Pohl, M.; Poireau, V.; Putze, A.; Quadrani, L.; Qi, X. M.; Qin, X.; Qu, Z. Y.; Räihä, T.; Rancoita, P. G.; Rapin, D.; Ricol, J. S.; Rodríguez, I.; Rosier Lees, S.; Rozhkov, A.; Rozza, D.; Sagdeev, R.; Sandweiss, J.; Saouter, P.; Schael, S.; Schmidt, S. M.; Schulz Von Dratzig, A.; Schwering, G.; Seo, E. S.; Shan, B. S.; Shi, J. Y.; Siedenburg, T.; Son, D.; Song, J. W.; Sun, W. H.; Tacconi, M.; Tang, X. W.; Tang, Z. C.; Tao, L.; Tescaro, D.; Ting, Samuel C. C.; Ting, S. M.; Tomassetti, N.; Torsti, J.; Türkoǧlu, C.; Urban, T.; Vagelli, V.; Valente, E.; Vannini, C.; Valtonen, E.; Vázquez Acosta, M.; Vecchi, M.; Velasco, M.; Vialle, J. P.; Vitale, V.; Vitillo, S.; Wang, L. Q.; Wang, N. H.; Wang, Q. L.; Wang, X.; Wang, X. Q.; Wang, Z. X.; Wei, C. C.; Weng, Z. L.; Whitman, K.; Wienkenhöver, J.; Willenbrock, M.; Wu, H.; Wu, X.; Xia, X.; Xiong, R. Q.; Xu, W.; Yan, Q.; Yang, J.; Yang, M.; Yang, Y.; Yi, H.; Yu, Y. J.; Yu, Z. Q.; Zeissler, S.; Zhang, C.; Zhang, J.; Zhang, J. H.; Zhang, S. D.; Zhang, S. W.; Zhang, Z.; Zheng, Z. M.; Zhu, Z. Q.; Zhuang, H. L.; Zhukov, V.; Zichichi, A.; Zimmermann, N.; Zuccon, P.
Authors of the University:
D'URSO Domenico
Handle:
https://iris.uniss.it/handle/11388/179692
Full Text:
https://iris.uniss.it//retrieve/handle/11388/179692/173100/PhysRevLett.117.091103.pdf
Published in:
PHYSICAL REVIEW LETTERS
Journal
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http://harvest.aps.org/bagit/articles/10.1103/PhysRevLett.117.091103/apsxml
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