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X-ray tomography using a CMOS area detector

Academic Article
Publication Date:
2007
Short description:
X-ray tomography using a CMOS area detector / Brunetti, A., Cesareo, R.. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - 258:2(2007), pp. 485-489. [10.1016/j.nimb.2007.02.067]
abstract:
A flat panel based on CMOS technology represents a valid alternative to other kinds of flat panels and to ccd detectors for X-ray imaging. Although the spatial resolution of the ccd sensors is better than that of a CMOS sensor, the last has a larger sensitive-area and it can work at room temperature reaching a dynamic performance comparable to that of a cooled ccd sensor. Other kinds of flat panels, such as TFT screen are much more expensive and they have lower spatial resolution and higher noise than the CMOS detector. In this paper, an application of the CMOS sensor to X-ray tomography is described. Preliminary results are reported and discussed.
Iris type:
1.1 Articolo in rivista
List of contributors:
Brunetti, Antonio; Cesareo, R.
Authors of the University:
BRUNETTI Antonio
Handle:
https://iris.uniss.it/handle/11388/57567
Published in:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Journal
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