Data di Pubblicazione:
2012
Citazione:
Hard X-rays meet soft matter: when bottom-up and top-down get along well / Innocenzi, P., Malfatti, L., Falcaro, P.. - In: SOFT MATTER. - ISSN 1744-683X. - 8:14(2012), pp. 3722-3729. [10.1039/c2sm07028f]
Abstract:
"The combined approach of bottom-up and top-down routes allows direct soft matter patterning and fabrication of devices using faster and more versatile protocols. In this research news, we briefly describe some of the fundamentals, development, recent progress and perspectives in the fabrication and patterning of functional nanostructured materials by interaction with high energy X-rays. "
Tipologia CRIS:
1.1 Articolo in rivista
Elenco autori:
Innocenzi, Plinio; Malfatti, Luca; Falcaro, P.
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